AEC - Q100-005 - Rev-D - 非易失性存储器程序-擦除耐久性.Non-Volatile Memory Program-Erase Endurance Data Retention and Operational Life Test.pdf

AEC - Q100-005 - REV-D October 11, 2011 Automotive Electronics Council Component Technical Committee ATTACHMENT 5 AEC - Q100-005 - REV-D NON-VOLATILE MEMORY PROGRAM/ERASE ENDURANCE, DATA RETENTION, AND OPERATING LIFE TEST AEC - Q100-005 - REV-D October 11, 2011 Automotive Electronics Council Component Technical Committee Acknowledgment Any document involving a complex technology brings together experience and skills from many sources. The Automotive Electronics Council would especially like to recognize the following significant contributors to the revision of this document: Sub-Committee Members: Friedrich Leisenberger AustriaMicrosystems Heinz Reiter AustriaMicrosystems Gregor Schatzberger AustriaMicrosystems Ramon Aziz Delphi Corporation Paul Hay Delphi Corporation Nick Lycoudes Freescale Peter Kuhn Freescale Suhail Mohammed Freescale Peter Kuhn Freescale Suhail Mohammed Freescale Werner Kanert Infineon Georg Tempel Infineon Bill Meyer Lattice Semiconductor Mike Buzinski Microchip Bob Knoell NXP Semiconductors Mark Gabrielle ON Semiconductor Peter Cosmin ON Semiconductor Francis Classe Spansion Meir Janai Spansion Colin Martin Texas Instrume